SWIR Machine Vision Cameras for Silicon Wafer Inspection
No. Standard CMOS and CCD sensors used in visible-light cameras are built on silicon photodiodes that have very low quantum efficiency above roughly 1000 nm, so adding an SWIR bandpass filter to a silicon-based sensor mainly blocks light without producing a usable image. A dedicated InGaAs sensor is required to achieve meaningful sensitivity across the […]
SWIR Machine Vision Cameras for Silicon Wafer Inspection Read More ยป